Calibration of atomic force microscope cantilevers using sta…
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- DOI 10.1088/0957-4484/24/1/015710
- PMID https://pubmed.ncbi.nlm.nih.gov/23220746
- OpenAlex ID W2104720263
- Type Article
- Language EN
- Published 10 Dec 2012
- Volume 24 (1)
- Pages 015710
- Source Nanotechnology
- Publisher IOP Publishing
- FWCI 2.51
- Countries 1
- Institutions 1
- Added 10 Oct 2025
- Updated 22 Sep 2026
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Calibration of atomic force microscope cantilevers using standard and inverted static methods assisted by FIB-milled spatial markers
Article 2012 EN Bronze
Static methods to determine the spring constant of AFM cantilevers have been widely used in the scientific community since the importance of such calibration techniques was established nearly 20 years ago. The most commonly used static techniques involve loading a trial cantilever with a known force by pressing it against a pre-calibrated standard or reference cantilever. These reference cantileve…
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4 authors| # | Author | Institutions | ORCID |
|---|---|---|---|
| 1 | Ashley D. Slattery | Flinders University (AU) | |
| 2 | Adam J. Blanch | Flinders University (AU) | |
| 3 | Jamie Scott Quinton | Flinders University (AU) | |
| 4 | Christopher T. Gibson Corresponding | Flinders University (AU) |
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