Thermally driven non-contact atomic force microscopy
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- DOI 10.1063/1.2037197
- OpenAlex ID W2140590704
- Type Article
- Language EN
- Published 02 Sep 2005
- Volume 87 (11)
- Source Applied Physics Letters
- Publisher American Institute of Physics
- FWCI 1.43
- Countries 1
- Institutions 1
- Added 10 Oct 2025
- Updated 12 Oct 2026
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Thermally driven non-contact atomic force microscopy
Article 2005 EN
In this letter a thermally driven frequency modulated atomic force microscopy (FM-AFM) technique is developed. Thermal fluctuations of the cantilever are employed to estimate the cantilever’s equivalent resonant frequency. The corresponding cantilever oscillations are the smallest possible at a given temperature. Related experiments that establish the feasibility of thermally driven FM-AFM in ambi…
38
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15
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4
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1.43
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4 authors| # | Author | Institutions | ORCID |
|---|---|---|---|
| 1 | Anil Gannepalli | Iowa State University (US) | — |
| 2 | Abu Sebastian | Iowa State University (US) | |
| 3 | J. P. Cleveland | — | — |
| 4 | Murti V. Salapaka | Iowa State University (US) |
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