Infrared surface absorption in Si(111)2×1 observed with refl…

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2002
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  • DOI 10.1103/physrevb.66.153307
  • OpenAlex ID W2010623429
  • Type Article
  • Language LV
  • Published 04 Oct 2002
  • Volume 66 (15)
  • Source Physical review. B, Condensed matter
  • Publisher American Physical Society
  • FWCI 2.02
  • Countries 1
  • Institutions 1
  • Added 24 Jun 2016
  • Updated 10 Oct 2026
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Infrared surface absorption in Si(111)2×1 observed with reflectance anisotropy spectroscopy

Article 2002 LV

Optical transitions between surface states associated with dangling bonds in $\mathrm{Si}(111)2\ifmmode\times\else\texttimes\fi{}1$ have been measured by means of reflection anisotropy spectroscopy in the near infrared. The results confirm those previously obtained with other optical techniques (namely surface differential reflectivity and photothermal deflection spectroscopies). The method does n…

37

Citations

21

References

5

Authors

2.02

FWCI

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5 authors
#AuthorInstitutionsORCID
1 C. Goletti University of Rome Tor Vergata (IT)
2 Gianlorenzo Bussetti University of Rome Tor Vergata (IT)
3 F. Arciprete University of Rome Tor Vergata (IT)
4 Piero Chiaradia University of Rome Tor Vergata (IT)
5 G. Chiarotti University of Rome Tor Vergata (IT)

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