Guilty or Not Guilty: Using Clone Metrics to Determine Open …
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- DOI 10.1109/ms.2010.159
- OpenAlex ID W1970103715
- Type Article
- Language EN
- Published 14 Dec 2010
- Volume 28 (2)
- Pages 42–47
- Source IEEE Software
- Publisher IEEE Computer Society
- FWCI 5.40
- Countries 1
- Institutions 2
- Added 10 Oct 2025
- Updated 21 Aug 2026
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Guilty or Not Guilty: Using Clone Metrics to Determine Open Source Licensing Violations
Article 2010 EN
To increase productivity, programmers often unwittingly violate open source software licenses by reusing code fragments, or clones. The authors explore metrics that can reveal the existence or absence of code reuse and apply these metrics to 1,225 open source product pairs.
17
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4
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5.40
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4 authors| # | Author | Institutions | ORCID |
|---|---|---|---|
| 1 | Akito Monden | Nara Institute of Science and … (JP) | |
| 2 | Satoshi Okahara | Nara Institute of Science and … (JP) | — |
| 3 | Yuki Manabe | The University of Osaka (JP) | |
| 4 | Kenichi Matsumoto | Nara Institute of Science and … (JP) |
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